• DocumentCode
    2520652
  • Title

    Multi-layers fluoroethylenepropylene (FEP) films bounded with adhesive tape to create piezoelectrets with controlled cavities

  • Author

    Falconi, D.R. ; Altafim, R.A.C. ; Altafim, R.A.P. ; Basso, H.C.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Sao Paulo, São Carlos, Brazil
  • fYear
    2011
  • fDate
    16-19 Oct. 2011
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    Multi-layer piezoelectrets of fluoropolymers prepared by thermal fusing processes have been already reported in different techniques. In this work, we present new piezoelectrets prepared without any heating procedure. The method used to produce these structures consists of bonding at least two films of fluoroethylenepropylene (FEP) with an adhesive tape between then. The cavities, necessary for the piezoelectric effect, are created pre-molding at least one of the films over a template in a press. Latter, the films are metalized with aluminum electrodes, arranged into a FEP-adhesive-FEP stack and charged. This process does not only allows a good control of the void geometry but also does not affect any previous treatment that can be performed on the surface of the fluoropolymer films to enhance piezoelectric activity. In this paper we also present previous results of the piezoelectric d33 coefficients over time and temperature exposure.
  • Keywords
    adhesives; electrets; electrodes; piezoelectricity; polymer films; voids (solid); FEP films; FEP-adhesive-FEP stack; adhesive tape; aluminum electrodes; controlled cavities; fluoropolymers; heating procedure; multilayer piezoelectrets; multilayers fluoroethylenepropylene films; piezoelectric activity; piezoelectric d33 coefficients; piezoelectric effect; pre-molding; temperature exposure; thermal fusing process; void geometry; Cavity resonators; Electrets; Films; Plastics; Stability analysis; Temperature measurement; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
  • Conference_Location
    Cancun
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4577-0985-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2011.6232615
  • Filename
    6232615