• DocumentCode
    252120
  • Title

    A 230ns settling time type-I PLL with 0.96mW TDC power and simple TV calculation algorithm

  • Author

    Ja-Yol Lee ; Mi-Jeong Park ; Hyun-Kyu Yu ; Cheon-Soo Kim

  • Author_Institution
    RF/Analog Circuit Lab., ETRI, Daejeon, South Korea
  • fYear
    2014
  • fDate
    3-6 Aug. 2014
  • Firstpage
    370
  • Lastpage
    373
  • Abstract
    This paper describes a fast-settling all-digital PLL with a low-power TDC based on retimed reference clock and a lock detector focused on monitoring a toggling phase error. With the intention of reducing power dissipation, the proposed TDC employs the low-rate reference (CKfref) and retimed reference (CKfros) clocks to measure the fine fractional phase error between the low-rate reference (CKfref) and high-rate oscillator (CKfosc) clocks. In addition, the use of the retimed reference clock to the TDC results in a new simple DCO clock period (TV) calculation algorithm which employs the maximum and minimum values for the fractional error correction (ε). A lock detector, which is required to accomplish the switchover of the DCO frequency tuning mode, allows a fast settling to be actuated independent of loop bandwidth and frequency step. By dissipating 8mW at 1.2-V supply voltage, the proposed digital PLL achieves 230ns settling time, 1.7psrms period jitter.
  • Keywords
    clocks; digital phase locked loops; low-power electronics; time-digital conversion; DCO clock period calculation algorithm; DCO frequency tuning mode; TV calculation algorithm; fast settling time all-digital type-I PLL; fine fractional phase error; fractional error correction; high-rate oscillator clocks; lock detector; low-power TDC; low-rate reference clocks; power 0.96 mW; power 8 mW; power dissipation reduction; retimed reference clock; retimed reference clocks; time 1.7 ps; time 230 ns; time-to-digital converter; toggling phase error; voltage 1.2 V; CMOS integrated circuits; Clocks; Delays; Detectors; Image edge detection; Phase locked loops; TV; DCO; PLL; TDC; phase-error compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
  • Conference_Location
    College Station, TX
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4799-4134-6
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2014.6908429
  • Filename
    6908429