DocumentCode :
2521418
Title :
Temperature Testing Tight Tolerance Crystal Units
Author :
Bistline, George, Jr.
fYear :
1963
fDate :
1963
Firstpage :
314
Lastpage :
315
Keywords :
Contracts; Frequency; Laboratories; Mass production; Materials testing; Production equipment; Temperature control; Temperature distribution; Temperature measurement; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
17th Annual Symposium on Frequency Control. 1963
Type :
conf
DOI :
10.1109/FREQ.1963.201268
Filename :
1540258
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2521418
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