Title :
Sapphire loaded cavity microwave oscillator with improved temperature stability
Author :
Tsarapkin, D.P. ; Shtin, N.A.
Author_Institution :
Radio Eng. Fac., Moscow Power Eng. Inst. (Tech. Univ.), Russia
Abstract :
Poor frequency-temperature stability of sapphire "whispering gallery" resonators (SWGR) is the main drawback of modern ultra-low phase noise room-temperature microwave sources using such resonators. This paper describes a novel dual-mode oscillator temperature control network where an auxiliary RF reference signal is formed by output frequency division. It eliminates the additional RF source and simplifies the oscillator on the whole. The completed temperature stabilizing system looks basically like a familiar noise suppression circuit with the differences that its frequency discriminator operates now at the second SWGR\´s mode and a control signal governs the temperature. A variable infrared heater is suggested to improve the dynamic characteristics of the temperature control. Estimation shows that in such configuration the fractional frequency instability of the order of 5×10-13 for measurement intervals from 1 to some hundred seconds is possible.
Keywords :
cavity resonators; circuit noise; dielectric resonator oscillators; frequency stability; microwave oscillators; phase noise; sapphire; temperature control; auxiliary RF reference signal; dual-mode oscillator temperature control network; frequency discriminator; frequency instability; frequency-temperature stability; output frequency division; sapphire loaded cavity microwave oscillator; sapphire whispering gallery resonators; temperature stability improvement; temperature stabilizing system; ultra-low phase noise microwave sources; variable infrared heater; Electromagnetic heating; Frequency conversion; Frequency estimation; Infrared heating; Microwave oscillators; Phase noise; RF signals; Radio frequency; Stability; Temperature control;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
DOI :
10.1109/FREQ.2002.1075947