Title :
A new stack capacitor for polysilicon active matrix arrays (TFTs)
Author :
Huang, T.-Y. ; Lewis, A.G. ; Wu, I.-W. ; Chiang, A. ; Bruce, R.H.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
Abstract :
A novel stack capacitor structure is proposed for dynamic data storage in circuits using self-aligned polysilicon thin-film transistor technology. Unlike the conventional planar thick-oxide capacitor formed between the gate-polysilicon storage node and the metal ground line, the stack capacitor is fabricated by adding an island-polysilicon plate underneath the gate-polysilicon storage node, thus creating a sandwiched stack capacitor structure. Owing to the high capacitance per unit area of the thin oxide capacitor, significant savings in chip area can be achieved. The stack capacitor structure has been successfully applied to active matrix arrays using self-aligned polysilicon thin-film transistors as the control switches. Improved data retention and decreased feed-through voltage, characteristic of higher storage capacitance, are demonstrated. The stack capacitor also features high immunity to crosstalk due to its unique surrounding ground plate which serves to screen each individual storage node. The capacitor therefore appears quite attractive for circuit applications which require large (>0.1-pF) capacitance.<>
Keywords :
elemental semiconductors; metal-insulator-semiconductor structures; thin film transistors; 0.1 pF; Si-SiO/sub 2/; active matrix arrays; capacitance; chip area; circuit applications; control switches; crosstalk; data retention; dynamic data storage; feed-through voltage; high immunity; island-polysilicon plate; metal ground line; sandwiched stack capacitor structure; stack capacitor; storage node; thin-film transistor; Active matrix technology; Capacitance; Capacitors; Circuits; Crosstalk; Memory; Switches; Thin film transistors; Transmission line matrix methods; Voltage;
Conference_Titel :
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1989.74297