DocumentCode
252229
Title
A built-in calibration system to optimize third-order intermodulation performance of RF amplifiers
Author
Yongsuk Choi ; Chun-Hsiang Chang ; Chauhan, Himanshu ; In-Seok Jung ; Onabajo, Marvin ; Yong-Bin Kim
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
599
Lastpage
602
Abstract
A digital built-in calibration (BIC) system is presented to automatically adjust the linearity performance of a tunable RF low-noise amplifier (LNA) operating at 2.4GHz. An envelope detection circuit is used to extract the linearity characteristics at low frequencies, enabling the sampling and digital signal processing at low rates. The output of the envelope detector is digitized before the spectrum calculation with an integrated fast Fourier transform (FFT) for estimation of the third-order intermodulation (IM3) distortion specification of the LNA. The digitally-assisted closed-loop calibration scheme is demonstrated with simulations using a two-tone test with 1MHz tone spacing, a 512-point FFT engine, a 10-bit analog-to-digital converter model, and digital blocks operating with a 51.2MHz clock frequency. The total calibration time is 485μs. The digital blocks were implemented using a standard 0.13μm CMOS technology.
Keywords
CMOS analogue integrated circuits; UHF amplifiers; UHF integrated circuits; calibration; detector circuits; fast Fourier transforms; intermodulation distortion; low noise amplifiers; BIC system; FFT; IM3 distortion specification; LNA; analog-to-digital converter model; digital blocks; digital built-in calibration system; digital signal processing; digitally-assisted closed-loop calibration scheme; envelope detection circuit; frequency 2.4 GHz; frequency 51.2 MHz; integrated fast Fourier transform; size 0.13 mum; spectrum calculation; standard CMOS technology; third-order intermodulation performance optimization; time 485 mus; tunable RF low-noise amplifier linearity performance; two-tone test; word length 10 bit; Calibration; Capacitors; Engines; Envelope detectors; Linearity; Radio frequency; System-on-chip; Low-noise amplifier (LNA); analog/RF testing; built-in calibration (BIC); envelope detection; fast Fourier transform (FFT); linearization; spectral analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908486
Filename
6908486
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