DocumentCode :
2522539
Title :
Expected Bayesian credible limit of reliability parameters in the case of zero-failure data for exponential distribution
Author :
Tianqun, Xu ; Yuepeng, Chen ; Tianhe, Xu ; Huanbin, Liu
Author_Institution :
Sch. of Sci., Wuhan Univ. of Technol., Wuhan, China
fYear :
2011
fDate :
23-25 May 2011
Firstpage :
3163
Lastpage :
3168
Abstract :
E-Bayesian credible limit estimations of failure rate, mean life and reliability based on four different prior distributions of hyper parameter are given for zero-failure data from products with exponential distribution. Relations among E-Bayesian credible limits and classical confidence limit are discussed. The results show that E-Bayesian credible limits are superior to the classical confidence limit. Finally, calculation is performed according to practical problem, and the analysis of estimation result is carried on.
Keywords :
Bayes methods; estimation theory; exponential distribution; reliability theory; E-Bayesian credible limit estimation; confidence limit; expected Bayesian credit limit; exponential distribution; failure rate; reliability parameter; zero-failure data; Bayesian methods; Copper; Density functional theory; Estimation; Exponential distribution; Reliability theory; E-Bayesian credible limit; exponential distribution; failure rate; reliability; zero-failure data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Decision Conference (CCDC), 2011 Chinese
Conference_Location :
Mianyang
Print_ISBN :
978-1-4244-8737-0
Type :
conf
DOI :
10.1109/CCDC.2011.5968800
Filename :
5968800
Link To Document :
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