Title :
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
Abstract :
The following topics are dealt with: memory test algorithms; pattern generation; DFT; thermal issues in manufacturing test; embedded cores; BIST synthesis; MCM testing; mixed-signal testing; integrated probe card; test synthesis; transistor level testing; board and system testing; MEMS; microprocessor testing; concurrent checking; fault modelling; ATE; burning cores; test software; ATPG; defect diagnosis; timing and jitter testing; manufacturing process monitoring; fault detection; IDDQ; online testing; test standards; design validation; logic diagnosis; embedded memories; ASIC testing; and logic testing
Keywords :
automatic test equipment; automatic testing; built-in self test; design for testability; electronic equipment testing; embedded systems; fault diagnosis; integrated circuit testing; logic testing; micromechanical devices; microprocessor chips; mixed analogue-digital integrated circuits; production testing; standards; ASIC testing; ATE; ATPG; BIST synthesis; DFT; IDDQ; MCM testing; MEMS; PCB testing; burning cores; concurrent checking; defect diagnosis; design validation; embedded cores; embedded memories; fault detection; fault modelling; integrated probe card; jitter test; logic diagnosis; logic testing; manufacturing process monitoring; manufacturing test; memory test algorithms; microprocessor testing; mixed-signal testing; online testing; pattern generation; system testing; test software; test standards; thermal test; timing test; transistor level testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743131
