Title :
Interrelation into physical properties and microstructural parameters of oxide materials
Author :
Kidyarov, B.I. ; Makukha, V.K.
Author_Institution :
Inst. of Semicond. Phys., Acad. of Sci., Novosibirsk, Russia
Abstract :
An analysis and a brief review of known data of electrooptical coefficients and nonlinear refractive indices of binary and ternary oxide materials have been carried out. Establishment of new phenomenological correlation between microscopic chemical structure and those macroscopic properties is presented
Keywords :
bond lengths; chemical structure; electro-optical effects; nonlinear optical susceptibility; refractive index; binary oxides; electrooptical coefficients; macroscopic properties; microscopic chemical structure; microstructural parameters; nonlinear optical susceptibility; nonlinear refractive indices; ternary oxides; Bonding; Chemicals; Crystalline materials; Crystals; Hydrogen; Nonlinear optics; Optical materials; Optical refraction; Physics; Semiconductor materials;
Conference_Titel :
Science and Technology, 1999. KORUS '99. Proceedings. The Third Russian-Korean International Symposium on
Conference_Location :
Novosibirsk
Print_ISBN :
0-7803-5729-9
DOI :
10.1109/KORUS.1999.876230
