DocumentCode :
2525069
Title :
Scan chain design for test time reduction in core-based ICs
Author :
Aerts, Joep ; Marinissen, Erik Jan
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
448
Lastpage :
457
Abstract :
The size of the test vector set forms a significant factor in the overall production costs of ICs, as it defines the test application time and the required pin memory size of the test equipment. Large core-based ICs often require a very large test vector set for a high test coverage. This paper deals with the design of scan chains as transport mechanism for test patterns from IC pins to embedded cores and vice versa. The number of pins available to accommodate scan test is given, as well as the number of scan test patterns and scannable flip flops of each core. We present and analyze three scan chain architectures for core-based ICs, which aim at a minimum test vector set size. We give experimental results of the three architectures for an industrial IC. Furthermore we analyze the test time consequences of reusing cores with fixed internal scan chains in multiple ICs with varying design parameters
Keywords :
automatic testing; boundary scan testing; design for testability; flip-flops; integrated circuit testing; logic testing; core-based IC; daisychain architecture; distribution architecture; embedded cores; fixed internal scan chain; high test coverage; multiple ICs; multiplexing architecture; number of scan test patterns; overall production cost; pin memory size; reduction of scan controls; reusable modules; reusing cores; scan chain design; scannable flip flops; test application time; test equipment; test time consequences; test time reduction; test vector set size; varying design parameters; Automatic testing; Circuit testing; Costs; Integrated circuit testing; Job shop scheduling; Laboratories; Logic testing; Pins; Production; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743185
Filename :
743185
Link To Document :
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