DocumentCode :
2526893
Title :
Research on the electrification of surface protective materials used in power electronic devices
Author :
Xiaobing, Dong ; Chuanxiang, Xu ; Shaoyun, Zhang
Author_Institution :
Xi´´an Jiaotong Univ., China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
978
Abstract :
The design of surface termination structure and the control of surface electrical field are the sticking points in the improvement of the withstand voltage and performance of power electronic devices. After the optimized terminal design of silicon devices, there is still a need for appropriate passivation layers and protection materials to protect the surface from contamination. In this paper, the electrification rule and mechanism of surface protection materials used in silicon devices are investigated using the charge separation method and the laser probe detection method. The influence on the withstand voltage of devices and stability at high temperature is also discussed
Keywords :
charge measurement; measurement by laser beam; passivation; power semiconductor devices; protective coatings; surface charging; surface contamination; charge separation method; electrification rule; high temperature stability; laser probe detection method; optimized terminal design; passivation layers; power electronic devices; silicon devices; surface contamination; surface electrical field control; surface protective material electrification; surface termination structure; withstand voltage; Design optimization; Optical materials; Passivation; Power electronics; Probes; Protection; Silicon devices; Surface contamination; Surface emitting lasers; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
Type :
conf
DOI :
10.1109/ICPADM.2000.876394
Filename :
876394
Link To Document :
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