DocumentCode :
2527100
Title :
[Front matter]
fYear :
2012
fDate :
16-18 May 2012
Firstpage :
1
Lastpage :
10
Abstract :
The following topics are dealt with: integrated system design; integrated system technology; and integrated system testing.
Keywords :
integrated circuit design; integrated circuit technology; integrated circuit testing; integrated system design; integrated system technology; integrated system testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2012 7th International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-1-4673-1926-3
Type :
conf
DOI :
10.1109/DTIS.2012.6232942
Filename :
6232942
Link To Document :
بازگشت