Title :
ALU based address generation for RAMs
Author :
Voyiatzis, I. ; Efstathiou, C. ; Hamdioui, S. ; Sgouropoulou, C.
Author_Institution :
Dept. of Inf., TEI of Athens, Athens, Greece
Abstract :
Memory Built-In Self-Test has become a standard industrial practice. Its quality is mainly determined by its fault detection capability in combination with its required area overhead. Address Generators have a significant contribution to the area overhead. Previously published schemes have proposed the address generator implementations based on counter modules. In this work we present an ALU-based address generator implementation; the proposed scheme present lower hardware overhead compared to the previously proposed one, provided the availability of the ALU or the counter in the circuit.
Keywords :
built-in self test; fault diagnosis; logic testing; random-access storage; ALU; RAM; address generation; address generators; counter modules; fault detection; memory built-in self-test; Built-in self-test; Circuit faults; Generators; Multiplexing; Nanoscale devices; Radiation detectors; Random access memory; ALU-based implementation; Address Generation; Memory BIST;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2012 7th International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-1-4673-1926-3
DOI :
10.1109/DTIS.2012.6232964
