DocumentCode
252830
Title
Mechanical modeling and characterization of silicon micro cooler
Author
Che, F.X. ; Yong Han ; Boon Long Lau ; Hengyun Zhang ; Lu Zhang ; Xiaowu Zhang
Author_Institution
Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
fYear
2014
fDate
3-5 Dec. 2014
Firstpage
822
Lastpage
827
Abstract
As chip power densities are now increasing beyond air cooling limits, a variety of liquid cooling methods are being investigated. The silicon microchannel cooling (SMC) is an attractive approach due to its high heat transfer coefficient. In this study, a thermal test chip with heating spots was mounted onto a synthetic diamond heat spreader, and then mounted onto the SMC cooler through temperature compression bonding (TCB) process. Finally, this structure was mounted onto the printed circuit board (PCB) and connected with the manifold. The reliability of the cooler system was investigated through mechanical modeling and characterization. Four types of models were conducted considering process flow and application conditions, including model of bonding thermal chip to heater spreader, model of whole cooler structure assembly, shear test model, and thermal-mechanical coupling analysis model considering hot spot heating. The cooler system was optimized based on finite element modeling results to reduce chip stress and package warpage. Die attach materials were also evaluated based on shear test and modeling results. The thermo-mechanical coupling simulation was conducted for cooler system by considering temperature non-uniform distribution due to hot spot and cooling effect. Results show that the designed cooler system meets the requirement of performance and reliability thermally and mechanically.
Keywords
cooling; elemental semiconductors; finite element analysis; microassembling; micromechanical devices; printed circuits; reliability; silicon; temperature distribution; thermal management (packaging); thermomechanical treatment; Si; chip stress; cooler structure assembly; die attach materials; finite element modeling; heater spreader; hot spot heating; mechanical modeling; mechanical reliability; package warpage; printed circuit board; shear test model; silicon microchannel cooling; silicon microcooler; temperature compression bonding process; temperature nonuniform distribution; thermal chip bonding; thermal reliability; thermal-mechanical coupling analysis model; Analytical models; Bonding; Diamonds; Heating; Materials; Microassembly; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
Conference_Location
Singapore
Type
conf
DOI
10.1109/EPTC.2014.7028364
Filename
7028364
Link To Document