Title :
A sensitivity analysis of the spectral mismatch correction procedure using wavelength-dependent error sources [solar cell testing]
Author :
King, David L. ; Hansen, Barry R.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Abstract :
A detailed investigation has been completed concerning the influence of wavelength-dependent random and bias measurement errors on the spectral mismatch correction procedure associated with solar cell performance measurements and reference cell calibration. It is shown that common distributions for random and bias measurement errors can result in an overall uncertainty of over ±3% in short-circuit current using a solar simulator. This analysis has also identified a reference cell calibration procedure with one-half the uncertainty associated with the best outdoor calibration procedure
Keywords :
calibration; electric current measurement; measurement errors; semiconductor device testing; sensitivity analysis; short-circuit currents; solar cells; measurement errors; performance measurements; reference cell calibration; semiconductor device testing; sensitivity analysis; short-circuit current; solar simulator; spectral mismatch correction procedure; uncertainty; wavelength-dependent error; Calibration; Extraterrestrial measurements; Measurement errors; Measurement standards; Photovoltaic cells; Photovoltaic systems; Sensitivity analysis; Solar power generation; Testing; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
DOI :
10.1109/PVSC.1991.169258
