Some microstructural characteristics of relaxor ferroelectrics

Author

Barber, D.J. ; Hilton, A.D. ; Baba-Kishi, K.Z.

Author_Institution

Dept. of Phys., Essex Univ., Colchester, UK

fYear

1988

fDate

12-16 Sep 1988

Firstpage

217

Abstract

A brief description of some of the main uses and dielectric characteristics of ferroelectric relaxor materials is given. Current ideas concerning the microstructural and microchemical origins of the dielectric properties of lead-based perovskite-structured oxide relaxors are presented. The unique ability of transmission electron microscopy to address most of these questions is outlined and illustrated with some recent results on the effects of excess lead oxide on relaxor microstructures

Keywords

ceramics; crystal microstructure; ferroelectric materials; lead compounds; permittivity; transmission electron microscope examination of materials; PbMgO₃NbO₃; PbScO₃NbO₃; PbScO₃TaO₃; ceramics; dielectric characteristics; dielectric constant; lead-based perovskite-structured oxide relaxors; microchemical origins; microstructural characteristics; relaxor ferroelectrics; transmission electron microscopy; Dielectric materials; Ferroelectric materials; Frequency; Indium; Lead compounds; Microscopy; Niobium compounds; Optical materials; Relaxor ferroelectrics; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of

Conference_Location

Beijing

Type

conf

DOI

10.1109/ICPADM.1988.38373

Filename

38373