Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components

This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and “black-box” approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the “stochastic testing” method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.