Title :
Sub-faults identification for collapsing in diagnosis
Author :
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution :
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
Abstract :
This paper presents a new way of fault collapsing called dominance with sub-faults(DSF) collapsing. The proposed approach reduces the number of tests required to diagnose a fault. Experimental results on the ISCAS´85 benchmarks demonstrate the impact of the proposed method over the traditional fault collapsing method
Keywords :
circuit testing; fault simulation; graph theory; DSF collapsing; fault collapsing method; fault diagnosis; Benchmark testing; Circuit faults; Dictionaries; Fault detection; Fault diagnosis; Fault location;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1692710
