• DocumentCode
    2532797
  • Title

    System level energy aware fault tolerance approach for real time system

  • Author

    Agrawal, Smriti ; Yadav, Rama Shankar ; Ranvijay

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Motilal Nehru Nat. Inst. of Technol., Allahabad
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper investigates an integrated approach to dynamic power management with fault tolerance in real time system. The system is composed of DVS processor (frequency dependent) and peripheral devices (frequency independent) with a better survival possibility in harsh environmental conditions. The fault tolerance is achieved via checkpointing and energy minimization is done by dynamic voltage scaling and dynamic power down techniques. We estimated a critical speed which effectively balanced the fault tolerance requirement of a system and the energy consumed by the associated frequency dependent and independent devices. The simulations results and examples illustrate that our proposed approach provides better tolerance to faults where existing approaches fail to survive and still consume lesser energy.
  • Keywords
    checkpointing; fault tolerant computing; minimisation; power aware computing; real-time systems; DVS processor; checkpointing; dynamic power down techniques; dynamic power management; dynamic voltage scaling; energy minimization; fault tolerance requirement; frequency dependent; harsh environmental conditions; peripheral devices; real time system; system level energy aware fault tolerance approach; Checkpointing; Dynamic voltage scaling; Energy management; Fault tolerance; Fault tolerant systems; Frequency dependence; Frequency estimation; Power system management; Real time systems; Voltage control; Checkpointing; Critical Speed; Dynamic Power Down; Dynamic Voltage Scaling; Hard Real Time System; Scheduling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766854
  • Filename
    4766854