DocumentCode
2533286
Title
Si hetero-bipolar transistor with an SiC emitter thin epitaxial base
Author
Sugii, T. ; Yamazaki, T. ; Suzuki, K. ; Fukano, T. ; Ito, T.
Author_Institution
Fujitsu Lab. Ltd., Kanagawa, Japan
fYear
1989
fDate
3-6 Dec. 1989
Firstpage
659
Lastpage
662
Abstract
A Si-based heterojunction bipolar transistor (Si-HBT) with polycrystalline SiC as a wide-bandgap emitter has been fabricated, combined with a 50-nm-thick highly doped base. The poly-SiC was used for the wide-bandgap material because of its lower growth temperature. The poly-SiC seems to be thermally more stable than amorphous or microcrystalline SiC. The resistivity of the SiC was sufficiently low. The current gain of 15, in spite of the highly doped base and lightly doped emitter, indicates that the structure has advantages over the conventional homobipolar transistor.<>
Keywords
elemental semiconductors; heterojunction bipolar transistors; semiconductor epitaxial layers; semiconductor technology; silicon; silicon compounds; 50 nm; 50-nm-thick highly doped base; Si hetero-bipolar transistor; SiC emitter; SiC-Si; current gain; heterojunction bipolar transistor; lightly doped emitter; lower growth temperature; polycrystalline SiC; resistivity; semiconductors; thin epitaxial base; wide-bandgap emitter; Bipolar transistors; Boron; Gases; Heterojunction bipolar transistors; Hydrogen; Inductors; Photonic band gap; Silicon carbide; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0817-4
Type
conf
DOI
10.1109/IEDM.1989.74366
Filename
74366
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