• DocumentCode
    2533286
  • Title

    Si hetero-bipolar transistor with an SiC emitter thin epitaxial base

  • Author

    Sugii, T. ; Yamazaki, T. ; Suzuki, K. ; Fukano, T. ; Ito, T.

  • Author_Institution
    Fujitsu Lab. Ltd., Kanagawa, Japan
  • fYear
    1989
  • fDate
    3-6 Dec. 1989
  • Firstpage
    659
  • Lastpage
    662
  • Abstract
    A Si-based heterojunction bipolar transistor (Si-HBT) with polycrystalline SiC as a wide-bandgap emitter has been fabricated, combined with a 50-nm-thick highly doped base. The poly-SiC was used for the wide-bandgap material because of its lower growth temperature. The poly-SiC seems to be thermally more stable than amorphous or microcrystalline SiC. The resistivity of the SiC was sufficiently low. The current gain of 15, in spite of the highly doped base and lightly doped emitter, indicates that the structure has advantages over the conventional homobipolar transistor.<>
  • Keywords
    elemental semiconductors; heterojunction bipolar transistors; semiconductor epitaxial layers; semiconductor technology; silicon; silicon compounds; 50 nm; 50-nm-thick highly doped base; Si hetero-bipolar transistor; SiC emitter; SiC-Si; current gain; heterojunction bipolar transistor; lightly doped emitter; lower growth temperature; polycrystalline SiC; resistivity; semiconductors; thin epitaxial base; wide-bandgap emitter; Bipolar transistors; Boron; Gases; Heterojunction bipolar transistors; Hydrogen; Inductors; Photonic band gap; Silicon carbide; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1989.74366
  • Filename
    74366