DocumentCode :
2535590
Title :
Device for conductance measurements of molecular systems
Author :
Lambacher, Michael ; Dupraz, Christian J F ; Beierlein, Udo ; Kotthaus, Jörg P. ; Schuber, Ulrich S. ; Andres, Philip R.
Author_Institution :
Center for NanoScience & Sekt. Phys., Ludwig-Maximilians-Univ., Munchen, Germany
fYear :
2004
fDate :
16-19 Aug. 2004
Firstpage :
515
Lastpage :
517
Abstract :
A device for conductance measurements of small molecular systems was fabricated. The device consists of two overlapping electrodes, separated by a thin layer of aluminium oxide. The oxide was partly etch away giving rise to a slit in which molecules can be inserted. Measurements were carried out on terpyridine based molecular chains.
Keywords :
aluminium compounds; electric admittance measurement; etching; molecular electronics; organic compounds; Al2O3; aluminium oxide; conductance measurements; etching; molecular systems; overlapping electrodes; terpyridine based molecular chains; thin layer; Chemistry; Electrodes; Electron beams; Etching; Gold; Laboratories; Lithography; Rough surfaces; Self-assembly; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2004. 4th IEEE Conference on
Print_ISBN :
0-7803-8536-5
Type :
conf
DOI :
10.1109/NANO.2004.1392404
Filename :
1392404
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2535590
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