Title :
Size determination of contaminants in HV XLPE cable insulation with holographic technique
Author :
Zhao, Hang ; Hu, Anping ; Tu, Dan ; Liu, Zhe ; Liu, L. ; Teng, W.
Author_Institution :
Dept. of Electr. Mater. Eng., Harbin Inst. of Electr. Technol.
Abstract :
A Fraunhofer far-field holographic technique has been used to develop a method which allows the size of particles of contaminants in an HV XLPE (high-voltage cross-linked polyethylene) cable insulating layer to be determined without cutting it into thin slices. The cable samples can be as thick as 4.0 cm when a resolution of 50 μm is achieved. The accuracy of the proposed method is within 10% for particles larger than 20 μm in diameter
Keywords :
cable insulation; holographic interferometry; organic insulating materials; particle size measurement; polymers; power cables; 20 micron; Fraunhofer far-field holographic technique; HV XLPE cable insulation; contaminant particle size; cross-linked polyethylene; high-voltage; polymers; power cables; Cable insulation; Dielectrics and electrical insulation; Holographic optical components; Holography; Optical microscopy; Optical recording; Optical surface waves; Polyethylene; Surface contamination; Trees - insulation;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1988. Proceedings., Second International Conference on Properties and Applications of
Conference_Location :
Beijing
DOI :
10.1109/ICPADM.1988.38494
