Title :
CMOS/SONOS nonvolatile memory technology for space and avionics applications
Author :
Adams, Dennis A. ; Smith, Joseph T. ; Murray, James R. ; White, Marvin H. ; Wrazien, Stephen ; Grant, Gary ; Dame, Jeffrey
Author_Institution :
Northrop Grumman Corp., Baltimore, MD
Abstract :
Silicon-oxide-nitride-oxide-semiconductor (SONOS) based nonvolatile semiconductor memories (NVSMs) have been in production for over 30 years for a wide range of commercial and military applications. SONOS nonvolatile memory technology relies on charge storage in this nitride dielectric. This technology has been proven to be highly reliable in the harsh environments encountered in space and avionics applications
Keywords :
CMOS memory circuits; avionics; dielectric materials; random-access storage; CMOS/SONOS nonvolatile memory technology; avionics applications; charge storage; nitride dielectric; nonvolatile semiconductor memories; silicon-oxide-nitride-oxide-semiconductor; space applications; Aerospace electronics; CMOS technology; EPROM; Laboratories; Nonvolatile memory; Production; SONOS devices; Silicon on insulator technology; Space missions; Space technology;
Conference_Titel :
Non-Volatile Memory Technology Symposium, 2005
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-9408-9
DOI :
10.1109/NVMT.2005.1541386
