• DocumentCode
    254307
  • Title

    Similarity-Aware Patchwork Assembly for Depth Image Super-resolution

  • Author

    Jing Li ; Zhichao Lu ; Gang Zeng ; Rui Gan ; Hongbin Zha

  • Author_Institution
    Key Lab. on Machine Perception, Peking Univ., Beijing, China
  • fYear
    2014
  • fDate
    23-28 June 2014
  • Firstpage
    3374
  • Lastpage
    3381
  • Abstract
    This paper describes a patchwork assembly algorithm for depth image super-resolution. An input low resolution depth image is disassembled into parts by matching similar regions on a set of high resolution training images, and a super-resolution image is then assembled using these corresponding matched counterparts. We convert the super resolution problem into a Markov Random Field (MRF) labeling problem, and propose a unified formulation embedding (1) the consistency between the resolution enhanced image and the original input, (2) the similarity of disassembled parts with the corresponding regions on training images, (3) the depth smoothness in local neighborhoods, (4) the additional geometric constraints from self-similar structures in the scene, and (5) the boundary coincidence between the resolution enhanced depth image and an optional aligned high resolution intensity image. Experimental results on both synthetic and real-world data demonstrate that the proposed algorithm is capable of recovering high quality depth images with X4 resolution enhancement along each coordinate direction, and that it outperforms state-of-the-arts [14] in both qualitative and quantitative evaluations.
  • Keywords
    Markov processes; image enhancement; image matching; image resolution; random processes; MRF labeling problem; Markov random field labeling problem; boundary coincidence; depth image super-resolution; geometric constraints; input low resolution depth image; qualitative evaluation; quantitative evaluation; resolution enhancement; self-similar structures; similar region matching; similarity-aware patchwork assembly; Assembly; DH-HEMTs; Databases; Energy resolution; Image edge detection; Image resolution; Training; Assembly; Disassemble; Dpeth map super resolution; Self-similarity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2014 IEEE Conference on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/CVPR.2014.431
  • Filename
    6909827