DocumentCode :
2544729
Title :
WCOMP: Waveform Comparison Tool for Mixed-signal Validation Regression in Memory Design
Author :
Zhang, Peng ; Luk, Wai-Shing ; Song, Yu ; Tong, Jiarong ; Tang, Pushan ; Zeng, Xuan
Author_Institution :
Intel Technol. Dev. Co., Ltd., Shanghai
fYear :
2007
fDate :
23-26 Jan. 2007
Firstpage :
209
Lastpage :
214
Abstract :
The increasing effort on full-chip validation constrains design cost and time-to-market. A waveform comparison tool named WCOMP is presented to automate mixed-signal validation regression in memory design. Unlike digital waveform comparison tools, WCOMP compares mixed-signal waveforms for functional match instead of graphical match, which tally with the requirements of full-chip validation regression. Simulations with different regression runs, process parameters, voltages and temperatures can be functionally compared. The methods are proved to be effective in Intelreg Flash memory design.
Keywords :
electronic design automation; flash memories; mixed analogue-digital integrated circuits; regression analysis; Flash memory design; WCOMP; automated mixed-signal validation regression; design cost; full-chip validation; functional match; time-to-market; waveform comparison tool; Analytical models; Application specific integrated circuits; Circuit simulation; Clocks; Computational modeling; Costs; Flash memory; Laboratories; Propagation delay; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
1-4244-0629-3
Electronic_ISBN :
1-4244-0630-7
Type :
conf
DOI :
10.1109/ASPDAC.2007.357987
Filename :
4196033
Link To Document :
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