• DocumentCode
    2544729
  • Title

    WCOMP: Waveform Comparison Tool for Mixed-signal Validation Regression in Memory Design

  • Author

    Zhang, Peng ; Luk, Wai-Shing ; Song, Yu ; Tong, Jiarong ; Tang, Pushan ; Zeng, Xuan

  • Author_Institution
    Intel Technol. Dev. Co., Ltd., Shanghai
  • fYear
    2007
  • fDate
    23-26 Jan. 2007
  • Firstpage
    209
  • Lastpage
    214
  • Abstract
    The increasing effort on full-chip validation constrains design cost and time-to-market. A waveform comparison tool named WCOMP is presented to automate mixed-signal validation regression in memory design. Unlike digital waveform comparison tools, WCOMP compares mixed-signal waveforms for functional match instead of graphical match, which tally with the requirements of full-chip validation regression. Simulations with different regression runs, process parameters, voltages and temperatures can be functionally compared. The methods are proved to be effective in Intelreg Flash memory design.
  • Keywords
    electronic design automation; flash memories; mixed analogue-digital integrated circuits; regression analysis; Flash memory design; WCOMP; automated mixed-signal validation regression; design cost; full-chip validation; functional match; time-to-market; waveform comparison tool; Analytical models; Application specific integrated circuits; Circuit simulation; Clocks; Computational modeling; Costs; Flash memory; Laboratories; Propagation delay; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    1-4244-0629-3
  • Electronic_ISBN
    1-4244-0630-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2007.357987
  • Filename
    4196033