DocumentCode
2544729
Title
WCOMP: Waveform Comparison Tool for Mixed-signal Validation Regression in Memory Design
Author
Zhang, Peng ; Luk, Wai-Shing ; Song, Yu ; Tong, Jiarong ; Tang, Pushan ; Zeng, Xuan
Author_Institution
Intel Technol. Dev. Co., Ltd., Shanghai
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
209
Lastpage
214
Abstract
The increasing effort on full-chip validation constrains design cost and time-to-market. A waveform comparison tool named WCOMP is presented to automate mixed-signal validation regression in memory design. Unlike digital waveform comparison tools, WCOMP compares mixed-signal waveforms for functional match instead of graphical match, which tally with the requirements of full-chip validation regression. Simulations with different regression runs, process parameters, voltages and temperatures can be functionally compared. The methods are proved to be effective in Intelreg Flash memory design.
Keywords
electronic design automation; flash memories; mixed analogue-digital integrated circuits; regression analysis; Flash memory design; WCOMP; automated mixed-signal validation regression; design cost; full-chip validation; functional match; time-to-market; waveform comparison tool; Analytical models; Application specific integrated circuits; Circuit simulation; Clocks; Computational modeling; Costs; Flash memory; Laboratories; Propagation delay; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.357987
Filename
4196033
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