DocumentCode :
2545379
Title :
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling
Author :
Méndez, Miguel A. ; Mateo, Diego ; Aragonès, Xavier ; González, Jose Luis
Author_Institution :
Electron. Eng. Dept., UPC, Barcelona, Spain
fYear :
2005
fDate :
12-16 Sept. 2005
Firstpage :
105
Lastpage :
108
Abstract :
The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.
Keywords :
CMOS integrated circuits; UHF integrated circuits; UHF oscillators; integrated circuit noise; phase noise; voltage-controlled oscillators; LC-tank VCO; package coupling; phase noise degradation; substrate noise; voltage controlled oscillators; Circuit noise; Circuit testing; Coupling circuits; Degradation; Digital circuits; Low-frequency noise; Packaging; Phase noise; Radio frequency; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN :
0-7803-9205-1
Type :
conf
DOI :
10.1109/ESSCIR.2005.1541569
Filename :
1541569
Link To Document :
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