• DocumentCode
    2545644
  • Title

    An on-chip jitter measurement circuit with sub-picosecond resolution

  • Author

    Jenkins, Keith A. ; Jose, Anup P. ; Heidel, David F.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2005
  • fDate
    12-16 Sept. 2005
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    A circuit for accurate on-chip measurement of timing jitter is demonstrated. Measurements with the circuit show excellent reproduction of corresponding off-chip measurements made with an oscilloscope, and resolution measurements show the jitter resolution of the circuit to be better than 0.4 ps rms. The circuit is very compact, occupying 3200 μm2 in a 0.13μm, 1.2V, CMOS technology, and operates up to 2.5 GHz in this technology.
  • Keywords
    CMOS integrated circuits; integrated circuit measurement; integrated circuit testing; timing jitter; 0.13 micron; 1.2 V; CMOS technology; jitter measurement circuit; jitter resolution; on-chip measurement; resolution measurements; timing jitter; CMOS technology; Circuit testing; Clocks; Counting circuits; Delay; Latches; Oscilloscopes; Semiconductor device measurement; Signal resolution; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
  • Print_ISBN
    0-7803-9205-1
  • Type

    conf

  • DOI
    10.1109/ESSCIR.2005.1541583
  • Filename
    1541583
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2545644