DocumentCode :
2545876
Title :
Integrated diagnostics: confusion and solutions
Author :
Dean, Jeffrey S.
Author_Institution :
SA-ALC/LDAE, San Antonio, TX, USA
fYear :
1996
fDate :
16-19 Sep 1996
Firstpage :
436
Lastpage :
440
Abstract :
This paper discusses the definition of integrated Diagnostics (ID), and some of the common misconceptions of what constitutes ID. As ID represents a powerful method for ensuring that weapon systems are developed with diagnostics capabilities that are both comprehensive end cost effective several proposals for enhancing and extending its application are proposed
Keywords :
automatic testing; economics; fault diagnosis; weapons; built in test; cost effectiveness; integrated diagnostics; military systems; weapon systems; Aging; Analytical models; Cost benefit analysis; Design engineering; Laboratories; Modeling; Proposals; System testing; Systems engineering and theory; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '96, Test Technology and Commercialization. Conference Record
Conference_Location :
Dayton, OH
ISSN :
1088-7725
Print_ISBN :
0-7803-3379-9
Type :
conf
DOI :
10.1109/AUTEST.1996.547771
Filename :
547771
Link To Document :
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