DocumentCode
2545967
Title
Optimization of Robust Asynchronous Circuits by Local Input Completeness Relaxation
Author
Jeong, Cheoljoo ; Nowick, Steven M.
Author_Institution
Dept. of Comput. Sci., Columbia Univ., New York, NY
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
622
Lastpage
627
Abstract
As process, temperature and voltage variations become significant in deep submicron design, timing closure becomes a critical challenge using synchronous CAD flows. One attractive alternative is to use robust asynchronous circuits which gracefully accommodate timing discrepancies. However, these asynchronous circuits typically suffer from high area and latency overhead. In this paper, an optimization algorithm is presented which reduces the area and delay of these circuits by relaxing their overly-restrictive style. The algorithm was implemented and experiments performed on a subset of MCNC circuits. On average, 49.2% of the gates could be implemented in a relaxed manner, 34.9% area improvement was achieved, and 16.1% delay improvement was achieved using a simple heuristic for targeting the critical path in the circuit. This is the first proposed approach that systematically optimizes asynchronous circuits based on the notion of local relaxation while still preserving the circuit´s overall timing-robustness.
Keywords
asynchronous circuits; logic design; optimisation; deep submicron design; local input completeness relaxation; local relaxation; optimization algorithm; robust asynchronous circuits; synchronous CAD flows; temperature variation; voltage variation; Asynchronous circuits; Cost function; Delay; Design automation; Electromagnetic interference; Logic circuits; Robustness; Temperature; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.358055
Filename
4196101
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