• DocumentCode
    2546741
  • Title

    Fault Dictionary Size Reduction for Million-Gate Large Circuits

  • Author

    Hong, Yu-Ru ; Huang, Juinn-Dar

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2007
  • fDate
    23-26 Jan. 2007
  • Firstpage
    829
  • Lastpage
    834
  • Abstract
    In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today´s million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.
  • Keywords
    fault diagnosis; integrated circuit testing; diagnostic resolution; fault dictionary size reduction; million-gate large circuits; Cause effect analysis; Circuit faults; Circuit testing; Dictionaries; Fabrication; Fault diagnosis; Manufacturing industries; Manufacturing processes; Runtime; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    1-4244-0629-3
  • Electronic_ISBN
    1-4244-0630-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2007.358092
  • Filename
    4196138