DocumentCode
2546741
Title
Fault Dictionary Size Reduction for Million-Gate Large Circuits
Author
Hong, Yu-Ru ; Huang, Juinn-Dar
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
fYear
2007
fDate
23-26 Jan. 2007
Firstpage
829
Lastpage
834
Abstract
In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today´s million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.
Keywords
fault diagnosis; integrated circuit testing; diagnostic resolution; fault dictionary size reduction; million-gate large circuits; Cause effect analysis; Circuit faults; Circuit testing; Dictionaries; Fabrication; Fault diagnosis; Manufacturing industries; Manufacturing processes; Runtime; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. ASP-DAC '07. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
1-4244-0629-3
Electronic_ISBN
1-4244-0630-7
Type
conf
DOI
10.1109/ASPDAC.2007.358092
Filename
4196138
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