Title :
A study of a prototype DAQ system with over 10 Gbps bandwidth for the SACLA X-ray experiments
Author :
Saji, C. ; Ohata, Takuma ; Sugimoto, Taku ; Tanaka, Ryo ; Yamaga, M.
Author_Institution :
SPring-8, Japan Synchrotron Radiat. Inst., Sayo, Japan
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We have developed a novel prototype front-end data acquisition (DAQ) system for a two-dimensional (2D) X-ray detector for X-ray free-electron laser (XFEL) experiments. The spring-8 angstrom compact free-electron laser (SACLA), a new XFEL facility at the super photon ring-8 GeV (SPring-8) site, is providing an XFEL for X-ray experiments. Because coherent X-ray imaging is one of our target experiments, a 2D X-ray detector is used to obtain detailed information of materials. The 2D X-ray detector is continually being upgraded, and its output data bandwidth has been drastically increased. A novel 2D X-ray sensor at SPring-8, the silicon-on-insulator photon imaging array sensor (SOPHIAS) detector is under development, and its design specification is more than 10 Gbps of bandwidth for a single sensor. Therefore, a new DAQ system with greater bandwidth is required, and hence, we have developed and evaluated a new front-end DAQ system that can handle data with more than 10 Gbps bandwidth. This system also allows flexible changing of input/output interfaces to support SOPHIAS detector upgrades that are both long-term and phase-by-phase. We describe the development of a new front-end DAQ system and present its evaluation results.
Keywords :
X-ray detection; X-ray imaging; data acquisition; free electron lasers; photons; 2D X-ray detector; SACLA X-ray experiment; SOPHIAS detector; SPring-8; X-ray free-electron laser experiment; X-ray imaging; XFEL experiment; XFEL facility; design specification; front-end DAQ system; front-end data acquisition system; silicon-on-insulator photon imaging array sensor detector; spring-8 angstrom compact free-electron laser; super photon ring-8 GeV;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551385