• DocumentCode
    2550993
  • Title

    Low-loss ultra-wideband transition between conductor-backed coplanar waveguide and substrate integrated waveguide

  • Author

    Chen, Xiao-Ping ; Wu, Ke

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytech., Montreal, QC, Canada
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    349
  • Lastpage
    352
  • Abstract
    A novel transition between conductor-backed coplanar waveguide (CBCPW) and substrate integrated waveguide (SIW) is presented for microwave and millimeter-wave integrated circuit design. The proposed integrated transition that can provide simultaneous field and impedance matching, exhibits outstanding low-loss performances over an ultra-wideband range (entire Ka-band in our case). In this work, a generalized impedance inverter whose parameters are accurately extracted by the use of a numerical Thru-Reflection-Line (TRL) calibration technique is utilized to design the transition. Measured results for the fabricated transition in back-to-back configuration show that the insertion loss is better than 0.4 dB while the return loss is better than 20 dB over the entire Ka-band.
  • Keywords
    MIMIC; MMIC; coplanar waveguides; impedance matching; substrate integrated waveguides; waveguide transitions; conductor-backed coplanar waveguide; impedance matching; microwave integrated circuit; millimeter-wave integrated circuit; substrate integrated waveguide; thru-reflection-line; ultra-wideband transition; Calibration; Circuits; Coplanar waveguides; Impedance; Inverters; Millimeter wave technology; Planar waveguides; Ultra wideband technology; Waveguide components; Waveguide transitions; Substrate Integrated Waveguide (SIW); conductor-backed coplanar waveguide (CBCPW); generalized impedance inverter; numerical Thru-Reflection-Line (TRL) calibration; transition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165705
  • Filename
    5165705