Title :
A charge collection study with dedicated RD50 charge multiplication sensors
Author :
Betancourt, C. ; Barber, T. ; Hauser, M. ; Jakobs, Kai ; Kuehn, S. ; ParzefaIl, U. ; Wonsak, S.
Author_Institution :
Phys. Inst., Albert-Ludwigs Univ., Freiburg, Germany
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
We investigate the charge collection efficiency of specially designed charge multiplication silicon strip detectors produced by MICRON in Liverpool under the framework of the CERN RD50 collaboration. Charge collection measurements are performed before and after proton and neutron irradiation to fluences of 1×1015 and 5×1015 1 MeV neq/cm2. Charge multiplication structures on these devices include varying diffusion times and energies for the implantation process, different sensor thicknesses, and several different strip width and pitch geometries. The charge collection for the charge multiplication devices is compared to standard silicon strip sensors with no charge multiplication properties.
Keywords :
neutron detection; proton detection; silicon radiation detectors; CERN RD50 collaboration; Liverpool; MICRON; charge collection efficiency; charge collection measurements; charge multiplication devices; charge multiplication silicon strip detectors; dedicated RD50 charge multiplication sensors; neutron irradiation; pitch geometries; proton irradiation; sensor thicknesses; standard silicon strip sensors; strip width; Charge multiplication; High energy physics; Radiation damage; Silicon strip detectors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551393