DocumentCode :
2551686
Title :
Performance of Glass GEM
Author :
Fujiwara, Toshihito ; Takahashi, Hiroki ; Uesaka, M.
Author_Institution :
Sch. of Eng., Univ. of Tokyo, Tokai, Japan
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
1766
Lastpage :
1767
Abstract :
Here we report the performance of Glass GEM. Our new GEM is fabricated in totally new process with photo-etch able glass. The glass is called PEG3, the photo-etchabale glass material manufactured by HOYA-PENTAX co. ltd. With this material, we succeed in fabricating a 700μm thick GEM with Cr and Cu layer electrodes. Glass GEMs enable to overcome the drawbacks of conventional polyimide GEMs, such as non-uniformity, smaller gain, and the outgas from the material. With the Glass GEM, we obtained 3×104 gas gain with a 5.9 keV (Fe-55) X-ray source.
Keywords :
electrodes; electron multiplier detectors; position sensitive particle detectors; Cr layer electrode; Cu layer electrode; HOYA-PENTAX co ltd; X-ray source; electron volt energy 5.9 keV; gas electron multiplier; glass GEM; photo-etchabale glass material; polyimide GEM; size 700 mum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551413
Filename :
6551413
Link To Document :
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