DocumentCode :
2552048
Title :
Accuracy improvement of the S-parameter adjoint sensitivity analysis for shape parameters
Author :
Zhu, Xiaying ; Nikolova, Natalia K.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
529
Lastpage :
532
Abstract :
The electromagnetic adjoint-based sensitivity analysis uses an exact formula in the case of material parameters, which yields sensitivity accuracy comparable to that of the numerical field solution. For shape parameters, however, the non-analytical adjoint approaches rely on a field approximation - the adjoint-field mapping, which may affect the accuracy of the computed sensitivity. We show that in the self-adjoint S-parameter sensitivity analysis, this approximation affects the accuracy of the transmission coefficients only (i.e., Skj, k ne j). We show that the averaging of the sensitivity estimates for the assumed forward and backward perturbations improves significantly the accuracy making it comparable to that of the exact sensitivities. Examples include a waveguide dielectric-resonator filter and a waveguide impedance transformer. The field analysis is performed with a commercial finite-element solver while the sensitivity analysis is performed in MATLABreg.
Keywords :
S-parameters; computational electromagnetics; finite difference time-domain analysis; sensitivity analysis; S-parameter adjoint sensitivity analysis; adjoint-field mapping; electromagnetic adjoint-based sensitivity analysis; field approximation; finite-difference frequency-domain method; finite-element solver; shape parameter; transmission coefficient; waveguide dielectric-resonator filter; waveguide impedance transformer; Dielectrics; Electromagnetic fields; Electromagnetic waveguides; Filters; Finite element methods; Impedance; Performance analysis; Scattering parameters; Sensitivity analysis; Shape; Sensitivity analysis; finite-difference frequency-domain (FDFD) method; self-adjoint sensitivity analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165750
Filename :
5165750
Link To Document :
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