DocumentCode :
2552481
Title :
Packaging effects on the figure of merit of a CMOS cascode low-noise amplifier: Flip-chip versus wire-bond
Author :
Han, Fu-Yi ; Lu, Kung-Chung ; Horng, Tzyy-Sheng ; Lin, Jenshan ; Cheng, Hung-Hsiang ; Chiu, Chi-Tsung ; Hung, Chih-Pin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
601
Lastpage :
604
Abstract :
A comprehensive study is presented to compare the effects between flip-chip and wire-bond packages on a front-end cascode low-noise amplifier (LNA) in a 2.4 GHz CMOS wireless local area network (WLAN) receiver. To construct the package electrical models, specific modeling dies are designed to help extract the equivalent-circuit elements from measured S-parameters for chip-package interconnects. Furthermore, the ground-proximity effect on on-chip spiral inductors in a flip-chip package is presented for the first time in this modeling study. For practical applications, the established package models are used in a chip-package co-simulation to predict the degradation of figure of merit for the cascode LNA under packaged condition.
Keywords :
CMOS integrated circuits; S-parameters; equivalent circuits; flip-chip devices; integrated circuit interconnections; lead bonding; low noise amplifiers; proximity effect (lithography); radiofrequency integrated circuits; wireless LAN; CMOS cascode low-noise amplifier; CMOS wireless local area network receiver; S-parameters measurement; chip-package co-simulation; chip-package interconnects; equivalent-circuit elements; flip-chip package; frequency 2.4 GHz; front-end cascode low-noise amplifier; ground-proximity effect; modeling dies; on-chip spiral inductors; package electrical models; packaging effects; wire-bond package; Electric variables measurement; Inductors; LAN interconnection; Low-noise amplifiers; Packaging; Scattering parameters; Semiconductor device measurement; Semiconductor device modeling; Spirals; Wireless LAN; Cascode LNA; chip-package co-simulation; figure of merit; flip-chip package; package model; wire-bond package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165768
Filename :
5165768
Link To Document :
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