DocumentCode :
2552553
Title :
Influence of the water temperature on measurements of Rn-222 in water by liquid scintillation counting of polycarbonates
Author :
Dimitrova, I. ; Georgiev, S. ; Mitev, K. ; Pressyanov, D.
Author_Institution :
Fac. of Phys., Sofia Univ. "St. Kliment Ohridski", Sofia, Bulgaria
fYear :
2012
fDate :
Oct. 27 2012-Nov. 3 2012
Firstpage :
1941
Lastpage :
1944
Abstract :
An approach for measurement of 222Rn in water has been recently proposed, in which polycarbonate specimens are exposed in the water and are afterwards measured by either gamma-spectrometry, gross beta-counting or liquid scintillation counting (LSC) or etched for alpha tracks. One of the advantages of this approach is that the specimens could be exposed directly in the water source. However, the signal is influenced by the temperature of the water. This work presents results that demonstrate this temperature influence for the case of LSC measurement of the exposed polycarbonates. In addition, results for the values of the partition coefficient K (quantifying the solubility of 222Rn from water to polycarbonate) and the diffusion length LD of radon in polycarbonate at temperatures which are typical for natural water sources are presented. Based on experimental results, polynomial functions are given that allow to estimate the values of K and LD for temperatures covering most of the range met in practice. These values could further be used to apply temperature corrections to the measurement signal for any of the above measurement techniques.
Keywords :
alpha-particle detection; liquid scintillation detectors; radon; water pollution measurement; 222Rn solubility; LSC measurement; Rn; alpha tracks; diffusion length; gamma-spectrometry; gross beta-counting; liquid scintillation counting; natural water sources; partition coefficient; polycarbonate specimens; polynomial functions; temperature corrections; water temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1082-3654
Print_ISBN :
978-1-4673-2028-3
Type :
conf
DOI :
10.1109/NSSMIC.2012.6551448
Filename :
6551448
Link To Document :
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