• DocumentCode
    2553601
  • Title

    TM scattering by a resistive card extension to a half plane

  • Author

    Kempel, L.C. ; Volakis, J.L.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1993
  • fDate
    June 28 1993-July 2 1993
  • Firstpage
    1738
  • Abstract
    A characterization of scattering by a metallic half-plane loaded with a resistive strip extension is presented. The aim is to derive simple and efficient solutions not associated with extensive computational demands. Three different solution methodologies are used. The first is a moment method formulation which computes the exact current on a strip extension by utilizing the metallic half plane Green´s function. A high-frequency solution is also used which follows the formal procedure outlined by M.I. Herman and J. L. Volakis (1987), which includes up to third-order diffraction (and surface wave) contributions. Finally, an approximate low-frequency solution is developed by introducing a physical basis function for the currents. The latter two solutions are found to be complementary and a combination of them may be used in place of the rigorous numerical solution.<>
  • Keywords
    Green´s function methods; computational complexity; electromagnetic wave scattering; method of moments; Green´s function; TM scattering; computational demands; high-frequency solution; metallic half-plane; moment method; numerical solution; physical basis function; resistive strip extension; solution methodologies; third-order diffraction; Aerospace control; Aircraft propulsion; Apertures; Current density; Diffraction; Frequency; Laboratories; Scattering; Shape control; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1993. AP-S. Digest
  • Conference_Location
    Ann Arbor, MI, USA
  • Print_ISBN
    0-7803-1246-5
  • Type

    conf

  • DOI
    10.1109/APS.1993.385537
  • Filename
    385537