DocumentCode :
255485
Title :
Extended feature extraction technique from fingerprint
Author :
Swain, S. ; Majhi, B. ; Dash, R.
Author_Institution :
Dept. of Comput. Sci., NIT Rourkela, Rourkela, India
fYear :
2014
fDate :
11-13 Dec. 2014
Firstpage :
1
Lastpage :
5
Abstract :
Automated Fingerprint Identification Systems (AFIS) currently rely only on Level 1 and Level 2 features. But these features are not much helpful for forensic experts as the experiment deals with partial to full print matching of latent fingerprint. Forensic experts takes the advantage of extended feature proposed by “Committee to Define an Extended Fingerprint Feature Set” (CDEFFS). This paper presents extraction technique of two extended features, dots and incipient ridges by tracing valleys. We have found starting points on the valley by analyzing the frequencies present in the fingerprint. Valley are traced from the starting point using first marching method ( FMM ). Then an intensity checking method is used for finding these features. Extensive simulation is carried out in MATLAB environment to show the superiority of the proposed feature extraction technique over state of art. Accuracy of the proposed feature extraction scheme also has been shown using special database 30 and IIIT Delhi database.
Keywords :
feature extraction; fingerprint identification; image matching; AFIS; FMM; IIIT Delhi database; Matlab environment; automated fingerprint identification systems; extended feature extraction technique; first marching method; incipient ridges; intensity checking method; latent fingerprint matching; Databases; Entropy; Equations; Feature extraction; Fingerprint recognition; Level set; NIST; dots and incipient; extended feature; fingerprint; level 3 feature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Conference (INDICON), 2014 Annual IEEE
Conference_Location :
Pune
Print_ISBN :
978-1-4799-5362-2
Type :
conf
DOI :
10.1109/INDICON.2014.7030491
Filename :
7030491
Link To Document :
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