• DocumentCode
    2556952
  • Title

    Design of a path delay fault simulator for evaluation of abist generated stimuli

  • Author

    Gjermundnes, Øystein ; Aas, Einar J.

  • Volume
    2
  • fYear
    2005
  • fDate
    25-28 July 2005
  • Firstpage
    107
  • Lastpage
    110
  • Keywords
    Circuit faults; Circuit simulation; Circuit testing; Delay; Electrical fault detection; Electronic mail; Fault detection; Integrated circuit modeling; Robustness; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research in Microelectronics and Electronics, 2005 PhD
  • Print_ISBN
    0-7803-9345-7
  • Type

    conf

  • DOI
    10.1109/RME.2005.1542948
  • Filename
    1542948
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2556952