DocumentCode :
2557786
Title :
Impact of the semiconductor diode structure on the virtual local oscillator leakage of GaAs sub-harmonic mixers
Author :
Gutta, Venkata ; Parker, Anthony E. ; Fattorini, Anthony
Author_Institution :
Dept. of Phys. & Eng., Macquarie Univ., Sydney, NSW, Australia
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
1509
Lastpage :
1512
Abstract :
Diode mismatch in an anti-parallel diode mixer results in an unwanted virtual leakage at twice the local oscillator pumping frequency. Random variability in a fabrication process is one of the sources of diode mismatch. In some fabrication processes, a diode usually consists of a transistor with source and drain shorted together. The layout of this structure introduces a systematic source of diode mismatch. An informed selection of the fabrication process is crucial in minimizing the systematic source of diode mismatch and improving the virtual local oscillator leakage.
Keywords :
III-V semiconductors; gallium arsenide; mixers (circuits); semiconductor diodes; GaAs; local oscillator pumping frequency; random variability fabrication process; semiconductor diode structure; subharmonic mixer; virtual local oscillator leakage; Circuits; Fabrication; Frequency; Gallium arsenide; HEMTs; Heterojunction bipolar transistors; Local oscillators; Mixers; Schottky diodes; Semiconductor diodes; Microwave Mixers; Millimeter wave mixers; Mixers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165995
Filename :
5165995
Link To Document :
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