Title :
A practical device for 1 nV accuracy measurements in Josephson arrays
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Abstract :
A reference voltage source for measurements of the electromotive force (EMF) of standard cells is presented. The device is easy to operate and is perfectly safe for standard cells. It measures the EMF of a standard cell with respect to the array voltage with a precision of 0.4 nV within a run; run-to-run variations of the cell EMF of +or-2 nV are observed over a 17-d period. However, to obtain these results the cell must be sufficiently stable and the temperature fluctuations must not exceed about 10 mu K during the measurement.<>
Keywords :
Josephson effect; cells (electric); electric potential; measurement errors; measurement standards; reference circuits; superconducting junction devices; voltage measurement; 1 mV; Josephson arrays; accuracy measurements; array voltage; electromotive force; reference voltage source; standard cells; temperature fluctuations; Circuit stability; Detectors; Force measurement; Frequency measurement; Josephson junctions; Leak detection; Measurement standards; Sensor arrays; Switches; Voltage measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.109957
