DocumentCode
2562002
Title
Precision mapping and calibration of electric fields using interference-narrowed Stark resonances
Author
van der Straten, P. ; Yang, D.-H. ; Lieberman, D. ; Bergeman, T. ; Metcalf, H.
Author_Institution
State Univ. of New York, Stony Brook, NY, USA
fYear
1990
fDate
11-14 June 1990
Firstpage
170
Lastpage
171
Abstract
The use of interference narrowing of Stark resonances for three-dimensional mapping of electric fields to an unprecedented level of precision is described. A method for calibration of electric fields to an accuracy currently limited only by theory is proposed. Measurements that were repeatable and reliable to a precision of 10 p.p.m. have been obtained. The accuracy of the method is limited by atomic constants rather than by the measurements of spacers and voltages and it is at least 100 times better than the conventional standard for field calibration.<>
Keywords
Stark effect; atomic resonant states; calibration; electric field measurement; accuracy; atomic constants; calibration; electric fields; interference-narrowed Stark resonances; three-dimensional mapping; Atomic measurements; Calibration; Electrostatic measurements; Interference; Laser beams; Laser excitation; Magnetic field measurement; Resonance; Spatial resolution; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location
Ottawa, Ontario, Canada
Type
conf
DOI
10.1109/CPEM.1990.109975
Filename
109975
Link To Document