• DocumentCode
    2562223
  • Title

    Comparative properties of copper wire array implosions driven by the pre-refurbished and post-refurbished generator

  • Author

    Apruzese, J.P. ; Thornhill, J.W. ; Giuliani, J.L. ; Coverdale, C.A. ; Jones, B. ; Ampleford, D.J.

  • Author_Institution
    Plasma Phys. Div., Naval Res. Lab., Washington, DC, USA
  • fYear
    2012
  • fDate
    8-13 July 2012
  • Abstract
    Summary form only given. The refurbishment of Sandia´s Z generator, completed in late 2007, represents a significant enhancement in its capabilities. In addition to increased operational efficiency and reliability, up to twice the previous energy can be stored in its present capacitors, allowing for greater load current and coupled energy. Despite losses occurring near the load, enhancements of current of ~ 15% and load energy coupling of >; 30% have been achieved in K-shell experiments. The effects of driving higher current and energy into a Z-pinch are expected to be most evident for K-shell radiating loads whose atomic numbers and difficulty of ionization placed them barely within the capability of the pre-refurbished Z. Copper is the highest atomic number element for which K-shell yields exceeding 20 kJ have been achieved, and is therefore a good candidate for a comparative analysis. We present such an analysis using spectroscopic and other data from shots taken on both the previous and present versions of Z.
  • Keywords
    Z pinch; copper; exploding wires; explosions; ionisation; plasma diagnostics; plasma transport processes; reliability; Cu; K-shell experiments; K-shell radiating loads; Sandia Z generator; Z-pinch; atomic numbers; capacitors; copper wire array implosions; coupled energy; ionization; load current; operational efficiency; operational reliability; post-refurbished Z generator; pre-refurbished Z generator; Atomic measurements; Copper; Generators; Laboratories; Physics; Security; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
  • Conference_Location
    Edinburgh
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4577-2127-4
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2012.6383765
  • Filename
    6383765