Title :
Toward the realization of a wavelength standard at 780 nm based on a laser diode frequency-locked to rubidium vapor
Author :
Tetu, M. ; Cyr, N. ; Villeneuve, B. ; Theriault, S. ; Breton, M. ; Tremblay, P.
Author_Institution :
Dept. de Genie Electr., Laval Univ., Ste-Foy, Que., Canada
Abstract :
The authors present the result of a study on the realization of an optical frequency standard based on a laser diode frequency-locked to Doppler resonance limited and sub-Doppler resonances of the /sup 87/Rb D/sub 2/-line (5S/sub 1/2/ from or to 5P/sub 3/2/, 780.027 nm). The characteristics of the signals obtained from the resonant phase-conjugate reflection, the nonlinear magnetic optical activity, and the saturated absorption are compared to the characteristics of the linear absorption signal. Improvement of laser diode frequency stability is discussed for these techniques. The experimental results indicate that the more complicated the system, the better defined is the reference line.<>
Keywords :
Doppler effect; frequency measurement; laser frequency stability; measurement standards; rubidium; semiconductor junction lasers; /sup 87/Rb; 780 nm; D/sub 2/-line; frequency locked diode; laser diode; linear absorption signal; nonlinear magnetic optical activity; optical frequency standard; reference line; resonant phase-conjugate reflection; saturated absorption; sub-Doppler resonances; wavelength standard; Absorption; Atom optics; Diode lasers; Frequency; Laser stability; Magnetic resonance; Nonlinear magnetics; Nonlinear optics; Optical mixing; Optical saturation;
Conference_Titel :
Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CPEM.1990.110009
