Title :
Performance degradation of OFDM signals passing through nonlinear circuits
Author :
Madani, Mohammad Hossein ; Abdipour, Abdolali ; Mohammadi, Abbas
Author_Institution :
Electr. Eng. Dept., Amirkabir Univ. of Technol., Tehran, Iran
Abstract :
This paper presents a theoretical analysis of performance degradation in an orthogonal frequency division multiplexing (OFDM) system when the signal is passed through a nonlinear circuit such as high power amplifier (HPA) which is modeled as a fifth order memory-less nonlinear polynomial model (5th order MLNPM). Theoretical analysis shows that the detected data symbol at the receiver consists of attenuated version of the original transmitted data symbol, third and fifth order intermodulation (IM) components. Analytical expressions for intermodulation noise term are derived using combinatorial methods. By use of the derived expressions, a closed form output signal to noise ratio, degradation factor (DF) and probability of error can be evaluated theoretically. For verifying the accuracy of our analysis a comparison between the theoretical and simulated results for one actual HPA are also presented.
Keywords :
OFDM modulation; error statistics; intermodulation; polynomials; power amplifiers; OFDM signal; closed form output signal to noise ratio; combinatorial methods; data symbol detection; degradation factor; fifth order intermodulation; fifth order memory-less nonlinear polynomial model; high power amplifier; nonlinear circuit; orthogonal frequency division multiplexing system; probability of error; receiver; theoretical analysis; Analytical models; Degradation; High power amplifiers; Nonlinear circuits; OFDM; Performance analysis; Polynomials; Power system modeling; Signal analysis; Signal to noise ratio; Degradation; Intermodulation; Nonlinear Circuit; OFDM;
Conference_Titel :
Ultra Modern Telecommunications & Workshops, 2009. ICUMT '09. International Conference on
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-3942-3
Electronic_ISBN :
978-1-4244-3941-6
DOI :
10.1109/ICUMT.2009.5345661