• DocumentCode
    2565255
  • Title

    Modeling thermal induced inter-symbol interference of feedback digital to analog converters in delta-sigma modulators

  • Author

    Shringarpure, Rahul ; Kaplan, Todd ; Valley, G. ; Petre, Peter ; Visher, John

  • Author_Institution
    HRL LLC, Malibu, CA, USA
  • fYear
    2004
  • fDate
    21-22 Oct. 2004
  • Firstpage
    14
  • Lastpage
    18
  • Abstract
    We propose a method to model inter-symbol interference due to temperature mismatch in the transistors of a 1-bit digital to analog converter (DAC) which is used to feedback the quantizer output in a 2nd order continuous time delta-sigma (CTΔΣ) modulator. The degradation in the signal to noise ratio (SNR) with thermal induced inter-symbol interference is reported. The phenomenon is modeled with Verilog-A, and simulated using the Cadence Spectre circuit simulator. The model provides device designers with insight into device behavior which affect circuit and system performance.
  • Keywords
    circuit feedback; circuit simulation; continuous time systems; delta-sigma modulation; hardware description languages; intersymbol interference; 2nd order continuous time delta-sigma modulator; Cadence Spectre circuit simulator; Verilog-A; delta-sigma modulators; feedback digital to analog converters; signal to noise ratio; temperature mismatch; thermal induced inter-symbol interference modeling; Circuit simulation; Delta modulation; Digital modulation; Digital-analog conversion; Hardware design languages; Interference; Output feedback; Signal to noise ratio; Temperature; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Behavioral Modeling and Simulation Conference, 2004. BMAS 2004. Proceedings of the 2004 IEEE International
  • Print_ISBN
    0-7803-8615-9
  • Type

    conf

  • DOI
    10.1109/BMAS.2004.1393975
  • Filename
    1393975