DocumentCode :
2565375
Title :
Path probability evaluation with repeated rates
Author :
Collet, Jérôme ; Renault, Isabelle
Author_Institution :
Electr. de France, Paris, France
fYear :
1997
fDate :
13-16 Jan 1997
Firstpage :
184
Lastpage :
187
Abstract :
In this paper we present a method for handling big Markovian graphs for reliability studies. If the model is Markovian, it is theoretically possible to generate and quantify the state graph. However, it is often not feasible, because of the number of states. One possibility, in the case of a reliability study, is to generate paths leading from the initial state of the system to the failure state. Then we get the system unreliability summing up the probability of all these paths. One difficulty of this approach, we focus on in this paper, is the computation of the probability of each path. When the sojourn rates in two states of the path have the same value, the classical formula used for the convolution of exponential distributions does not fit any longer. We found help for a theoretical solution in a paper by P.G. Harrison (see J. Appl. Probab., vol.27, p.74-87, 1990). Two problems arose during the implementation: numerical errors, and huge computing times. Our tests show that the performance problem is very important, whereas the numerical one is not. Furthermore, we know that, in most of the cases, we do not need exact probability evaluation. Then, we are currently searching for a simplified method, which could be pessimistic, and would have to be numerically robust, and fast
Keywords :
Markov processes; exponential distribution; graph theory; reliability theory; big Markovian graphs; exponential distributions; numerical errors; path probability evaluation; reliability studies; repeated rates; sojourn rates; state graph generation; state graph quantification; system unreliability; Availability; Computational efficiency; Convolution; Density functional theory; Exponential distribution; Reactive power; Reliability theory; Robustness; Software tools; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location :
Philadelphia, PA
ISSN :
0149-144X
Print_ISBN :
0-7803-3783-2
Type :
conf
DOI :
10.1109/RAMS.1997.571703
Filename :
571703
Link To Document :
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