Keywords :
Analog circuits; CMOS analog integrated circuits; CMOS technology; Dynamic range; Dynamic voltage scaling; Energy consumption; Low voltage; Pipelines; Power dissipation; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0079-1
DOI :
10.1109/ISSCC.2006.1696027
