Title :
Extremum seeking micro-thermal-fluid control for active two-phase microelectronics cooling
Author :
Zhang, TieJun ; Wen, John T. ; Julius, Agung ; Peles, Yoav ; Jensen, Michael K.
Author_Institution :
Center for Autom. Technol. & Syst., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
To address increasing power densities in high power electronic devices, microchannel systems operating in the two-phase regime have been explored in recent years for high heat flux cooling applications. However, flow and thermal oscillations, frequently present in two-phase microchannel cooling, may severely compromise the cooling performance and system integrity. This paper considers the thermal-fluid control of a microchannel evaporator by regulating the inlet flow rate using a pump. The control objective is two-fold: stabilize the fluid flow and maintain a low evaporator wall temperature. The first objective is easily achieved with a proportional feedback of flow acceleration. The second objective is more challenging as the achievable wall temperature depends on the heat transfer coefficient which in turn depends on the flow rate and heat load and is typically not well characterized. In this paper, we present an adaptive extremum seeking control law which first uses the wall temperature measurement to estimate the heat transfer coefficient, and then adjusts the flow rate to maximize this estimate. Simulation results demonstrate the efficacy of the proposed scheme.
Keywords :
cooling; flow control; integrated circuits; thermal management (packaging); active two-phase microelectronics cooling; adaptive extremum seeking control law; cooling performance; evaporator wall temperature; extremum seeking microthermal-fluid control; flow acceleration; flow oscillation; fluid flow; heat transfer coefficient; high heat flux cooling; high power electronic devices; inlet flow rate; microchannel evaporator; microchannel systems; power densities; proportional feedback; system integrity; thermal oscillation; two-phase microchannel cooling; two-phase regime; wall temperature measurement; Cooling; Heat transfer; Heating; Microchannel; Oscillators; Temperature measurement; Thermal stability;
Conference_Titel :
Decision and Control (CDC), 2010 49th IEEE Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7745-6
DOI :
10.1109/CDC.2010.5717101